A method for classifying errors in the layout of a semiconductor circuit includes examining the layout of the semiconductor circuit for infringement of predetermined design rules in order to establish errors. For each error, the error is marked in the layout, and information about the error and the layout of the semiconductor circuit in an area surrounding the error is extracted. The extracted information is compared with prestored information within a multiplicity of classes, and the error is assigned to the respective class on the basis of the compared information.