Invention Grant
- Patent Title: Integrated x-ray measurement tool for equine conformation
- Patent Title (中): 用于马构象的综合x射线测量工具
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Application No.: US11956179Application Date: 2007-12-13
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Publication No.: US07716843B2Publication Date: 2010-05-18
- Inventor: Pete Healey
- Applicant: Pete Healey
- Agent Felix L. Fischer
- Main IPC: G06K9/00
- IPC: G06K9/00 ; A01L11/00

Abstract:
A flat transparent overlay for measurement of equine foot x-rays employs a flat lower edge for alignment with a ground surface and an anterior edge angled to approximate a hoof distal wall. A first sight ring positions the tool over a tip of an image of a third phalanx. Six interrelated scales are provided for measurement of the palmar cortex, distal sole thickness, break-over distance and coronet band to extensor process distance, and in conjunction with a second site ring, center of rotation and palmar sole thickness. A first protractor element is centered posterior on the first sight ring for measurement of the palmar angle. A dual scale extends from the angled anterior edge portion with a measurement line for measurement of the hoof-lamella zone. A second protractor element is posterior to and centered on the second sight ring for measurement of a pastern angle.
Public/Granted literature
- US20090151176A1 INTEGRATED X-RAY MEASUREMENT TOOL FOR EQUINE CONFORMATION Public/Granted day:2009-06-18
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