Invention Grant
- Patent Title: Tungsten sputtering target and method of manufacturing the target
- Patent Title (中): 钨溅射靶和制造目标的方法
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Application No.: US10363257Application Date: 2001-09-03
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Publication No.: US07718117B2Publication Date: 2010-05-18
- Inventor: Koichi Watanabe , Yoichiro Yabe , Takashi Ishigami , Takashi Watanabe , Hitoshi Aoyama , Yasuo Kohsaka , Yukinobu Suzuki
- Applicant: Koichi Watanabe , Yoichiro Yabe , Takashi Ishigami , Takashi Watanabe , Hitoshi Aoyama , Yasuo Kohsaka , Yukinobu Suzuki
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2000-270998 20000907; JP2001-161617 20010530
- International Application: PCT/JP01/07612 WO 20010903
- International Announcement: WO02/20865 WO 20020314
- Main IPC: B22F1/02
- IPC: B22F1/02 ; C23C14/00

Abstract:
A method of manufacturing a tungsten sputtering target includes pressing a high purity tungsten powder to form a pressed compact, first sintering the pressed compact at a temperature of 1450-1700° C. for one hour or longer after the pressed compact is heated at a heating-up rate of 2-5° C./min on the way to a maximum sintering temperature, second sintering the pressed compact to form a sintered body at a temperature of 1900° C. or higher for 5 hours or longer, working the sintered body to obtain a shape of a target, subjecting the target to a grinding work of at least one of rotary grinding and polishing, and subjecting the target to a finishing work of at least one of etching and reverse sputtering.
Public/Granted literature
- US20050029094A1 Tungsten sputtering target and method of manufacturing the target Public/Granted day:2005-02-10
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