Invention Grant
- Patent Title: Glitch reduced delay lock loop circuits and methods for using such
- Patent Title (中): 毛刺减少延迟锁回路电路及使用方法
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Application No.: US11832021Application Date: 2007-08-01
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Publication No.: US07719332B2Publication Date: 2010-05-18
- Inventor: Keerthinarayan P. Heragu , Padattil K. Nisha
- Applicant: Keerthinarayan P. Heragu , Padattil K. Nisha
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent Dawn V. Stephens; Wade James Brady, III; Frederick J. Telecky, Jr.
- Main IPC: H03L7/06
- IPC: H03L7/06

Abstract:
Delay lock loop circuits are described, which may include two or more delay stages that each includes a plurality of selectable delay elements. A reference signal drives an input of the first delay stage, which provides a first output. The first output drives an input of the second delay stage, which provides a second output. The circuits further include a first selector register that is associated with the first delay stage. A value maintained in the first selector register determines a number of the selectable delay elements utilized in the first delay stage. The circuits further include a second selector register associated with the second delay stage. A value maintained in the second selector register determines a number of the selectable delay elements utilized in the second delay stage. Modification of the values maintained in the first and second selector registers are synchronized to the first and second outputs, respectively.
Public/Granted literature
- US20090033385A1 Glitch Reduced Delay Lock Loop Circuits and Methods for Using Such Public/Granted day:2009-02-05
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