Invention Grant
- Patent Title: Signal measuring apparatus and semiconductor testing apparatus
- Patent Title (中): 信号测量仪和半导体测试仪
-
Application No.: US11979581Application Date: 2007-11-06
-
Publication No.: US07719451B2Publication Date: 2010-05-18
- Inventor: Mamoru Tamba
- Applicant: Mamoru Tamba
- Applicant Address: JP Tokyo
- Assignee: Yokogawa Electric Corporation
- Current Assignee: Yokogawa Electric Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2006-302639 20061108
- Main IPC: H03M1/10
- IPC: H03M1/10

Abstract:
In order to provide a signal measuring apparatus which satisfies multiple performances at a high level all together, the signal measuring apparatus includes: DC performance; noise performance; distortion performance; spurious performance; and the like, a signal measuring apparatus includes: multiple A/D converters which respectively have different conversion characteristics for converting from an analog signal outputted from a DUT to digital signals; digital circuits which are provided in correspondence with the A/D converters and which conduct predetermined operations based on the conversion characteristics of the A/D converters.
Public/Granted literature
- US20080109179A1 Signal measuring apparatus and semiconductor testing apparatus Public/Granted day:2008-05-08
Information query