Invention Grant
US07720137B2 Characterization of a frequency response for a frequency translation device 有权
频率转换装置的频率响应的表征

  • Patent Title: Characterization of a frequency response for a frequency translation device
  • Patent Title (中): 频率转换装置的频率响应的表征
  • Application No.: US11583188
    Application Date: 2006-10-18
  • Publication No.: US07720137B2
    Publication Date: 2010-05-18
  • Inventor: Yi HeMarcus K. Da Silva
  • Applicant: Yi HeMarcus K. Da Silva
  • Applicant Address: US OR Beaverton
  • Assignee: Tektronix, Inc.
  • Current Assignee: Tektronix, Inc.
  • Current Assignee Address: US OR Beaverton
  • Agent Francis I. Gray; Michael A. Nelson
  • Main IPC: H04B17/00
  • IPC: H04B17/00
Characterization of a frequency response for a frequency translation device
Abstract:
A method of characterizing the frequency response of a frequency translation device over a wide IF bandwidth is based on a two-dimensional model to generate calibration data for a device at run-time. The model is a function of a center frequency and frequency offset for a plurality of center frequencies over a wide system bandwidth to produce a frequency response at each center frequency. The frequency responses at each center frequency are scaled and normalized relative to a reference frequency and stored.
Information query
Patent Agency Ranking
0/0