Invention Grant
- Patent Title: Characterization of a frequency response for a frequency translation device
- Patent Title (中): 频率转换装置的频率响应的表征
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Application No.: US11583188Application Date: 2006-10-18
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Publication No.: US07720137B2Publication Date: 2010-05-18
- Inventor: Yi He , Marcus K. Da Silva
- Applicant: Yi He , Marcus K. Da Silva
- Applicant Address: US OR Beaverton
- Assignee: Tektronix, Inc.
- Current Assignee: Tektronix, Inc.
- Current Assignee Address: US OR Beaverton
- Agent Francis I. Gray; Michael A. Nelson
- Main IPC: H04B17/00
- IPC: H04B17/00

Abstract:
A method of characterizing the frequency response of a frequency translation device over a wide IF bandwidth is based on a two-dimensional model to generate calibration data for a device at run-time. The model is a function of a center frequency and frequency offset for a plurality of center frequencies over a wide system bandwidth to produce a frequency response at each center frequency. The frequency responses at each center frequency are scaled and normalized relative to a reference frequency and stored.
Public/Granted literature
- US20080095271A1 Characterization of a frequency response for a frequency translation device Public/Granted day:2008-04-24
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