Invention Grant
- Patent Title: Method for diagnosis of functional faults in a functional architecture
- Patent Title (中): 功能架构功能故障诊断方法
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Application No.: US10539128Application Date: 2003-12-19
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Publication No.: US07720638B2Publication Date: 2010-05-18
- Inventor: Samuel Boutin
- Applicant: Samuel Boutin
- Applicant Address: FR Boulogne Billancourt
- Assignee: Renault S.A.S.
- Current Assignee: Renault S.A.S.
- Current Assignee Address: FR Boulogne Billancourt
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: FR0216353 20021220
- International Application: PCT/FR03/03851 WO 20031219
- International Announcement: WO2004/059407 WO 20040715
- Main IPC: G06F11/30
- IPC: G06F11/30

Abstract:
A method for diagnosis of functional faults in a functional architecture, including a unit of functions connected to electronic components, producing and using data, at least one datum of which can adopt a fixed pre-determined value, following occurrence of an erroneous functioning of at least one of the components of the unit. The method, while having a unit of functions and carrying out a function for which the input and output data can be assigned to sensors or actuators, determines particular values during which the particular values corresponding to functional faults for the sensors and actuators are listed and generates the functional diagnostic for the function as a function of the lists determined during the determining.
Public/Granted literature
- US20060247872A1 Method for diagnosis of functional faults in a functional architecture Public/Granted day:2006-11-02
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