Invention Grant
- Patent Title: Measurement fault detection
- Patent Title (中): 测量故障检测
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Application No.: US12032999Application Date: 2008-02-18
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Publication No.: US07720642B2Publication Date: 2010-05-18
- Inventor: Keith Jacob Brodie
- Applicant: Keith Jacob Brodie
- Applicant Address: US CA San Jose
- Assignee: SiRF Technology, Inc.
- Current Assignee: SiRF Technology, Inc.
- Current Assignee Address: US CA San Jose
- Agency: RatnerPrestia
- Main IPC: G06F11/30
- IPC: G06F11/30 ; G06F15/00
Abstract:
The present invention discloses a method and an apparatus for improving measurement fault detection in a sequential measurement processing estimator, and is particularly applied to Global Positioning Receivers.
Public/Granted literature
- US20080204316A1 MEASUREMENT FAULT DETECTION Public/Granted day:2008-08-28
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