Invention Grant
US07720645B2 Test apparatus for digitized test responses, method for testing semiconductor devices and diagnosis method for a semiconductor device
有权
用于数字化测试响应的测试装置,半导体器件测试方法和半导体器件的诊断方法
- Patent Title: Test apparatus for digitized test responses, method for testing semiconductor devices and diagnosis method for a semiconductor device
- Patent Title (中): 用于数字化测试响应的测试装置,半导体器件测试方法和半导体器件的诊断方法
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Application No.: US11534005Application Date: 2006-09-21
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Publication No.: US07720645B2Publication Date: 2010-05-18
- Inventor: Stephane Kirmser , Heinz Mattes , Sebastian Sattler
- Applicant: Stephane Kirmser , Heinz Mattes , Sebastian Sattler
- Applicant Address: DE Munich
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Munich
- Agency: Banner & Witcoff, Ltd.
- Priority: DE102005045183 20050921
- Main IPC: G01R31/28
- IPC: G01R31/28

Abstract:
A test apparatus for testing digitized test responses has a generator and a signal extractor. The generator uses direct digital synthesis to generate a set of n digital reference signals which are orthogonal to one another. In this case, n is a natural number greater than 1. The signal extractor contains a test input and reference inputs. The test input receives a digitized test response and the reference inputs are connected to the reference signals which are generated by the generator. The signal extractor generates scalar products from a respective reference signal and the test response and uses the products to calculate whether a combination of reference signals is contained in the test response.
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