Invention Grant
US07720645B2 Test apparatus for digitized test responses, method for testing semiconductor devices and diagnosis method for a semiconductor device 有权
用于数字化测试响应的测试装置,半导体器件测试方法和半导体器件的诊断方法

Test apparatus for digitized test responses, method for testing semiconductor devices and diagnosis method for a semiconductor device
Abstract:
A test apparatus for testing digitized test responses has a generator and a signal extractor. The generator uses direct digital synthesis to generate a set of n digital reference signals which are orthogonal to one another. In this case, n is a natural number greater than 1. The signal extractor contains a test input and reference inputs. The test input receives a digitized test response and the reference inputs are connected to the reference signals which are generated by the generator. The signal extractor generates scalar products from a respective reference signal and the test response and uses the products to calculate whether a combination of reference signals is contained in the test response.
Information query
Patent Agency Ranking
0/0