Invention Grant
- Patent Title: Exposure apparatus and method, and device manufacturing method
- Patent Title (中): 曝光装置及方法及装置制造方法
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Application No.: US11614416Application Date: 2006-12-21
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Publication No.: US07724348B2Publication Date: 2010-05-25
- Inventor: Yoshio Gomei , Hiromitsu Takase , Shigeru Terashima
- Applicant: Yoshio Gomei , Hiromitsu Takase , Shigeru Terashima
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Fitzpatrick, Cella, Harper & Scinto
- Priority: JP2005-255090 20050902
- Main IPC: G03B27/52
- IPC: G03B27/52 ; G03B27/42

Abstract:
An exposure apparatus for exposing a substrate to exposure light via an original. The apparatus includes a reflector, which includes a multilayer film and a ruthenium film, and reflects the exposure light. The multilayer film reflects the exposure light, and the ruthenium film is arranged on the multilayer film. A vacuum container contains the reflector, an exhauster exhausts exhaust gas in the vacuum container, and a regulator supplies water vapor into the vacuum container and regulates an amount of the water vapor in the vacuum container, based on an amount of carbonaceous gas in the vacuum chamber, so as to retard oxidation of the ruthenium film.
Public/Granted literature
- US20070097342A1 EXPOSURE APPARATUS AND METHOD, AND DEVICE MANUFACTURING METHOD Public/Granted day:2007-05-03
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