A system and method for EVM self-testing a communication device is provided including receiving (305) a complex waveform, sampling (310) first and second sample voltages from the complex waveform, selecting (315) first and second ideal voltages from I- and Q-arrays, and determining (320) an error vector by comparing the first and second sample voltages with the first and second ideal voltages for a desired number of comparisons (N). The first ideal voltage corresponds with the first sample voltage, the second ideal voltage corresponds with the second sample voltage, and the I- and Q-arrays are derived from a conversion of a bitstream to the complex waveform.