Invention Grant
- Patent Title: X-ray diagnostic apparatus and X-ray diagnostic system
- Patent Title (中): X光诊断仪和X光诊断系统
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Application No.: US11861903Application Date: 2007-09-26
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Publication No.: US07724873B2Publication Date: 2010-05-25
- Inventor: Takuya Sakaguchi , Toshihiro Rifu
- Applicant: Takuya Sakaguchi , Toshihiro Rifu
- Applicant Address: JP Tokyo JP Otawara-shi
- Assignee: Kabushiki Kaisha Toshiba,Toshiba Medical Systems Corporation
- Current Assignee: Kabushiki Kaisha Toshiba,Toshiba Medical Systems Corporation
- Current Assignee Address: JP Tokyo JP Otawara-shi
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2006-271024 20061002
- Main IPC: H05G1/64
- IPC: H05G1/64

Abstract:
An X-ray diagnostic apparatus includes a bed, an X-ray generating unit, an X-ray detection unit, a support which movably supports the X-ray generating unit and the X-ray detection unit, an X-ray application switch which triggers generation of X-rays from the X-ray generating unit, an operation unit for moving the X-ray generating unit and the X-ray detection unit, an image generating unit which generates an image on the basis of an output from the X-ray detection unit, a display unit which is placed near the bed and displays the image, and a simulation image generating unit which generates a simulation image from stored data during a simulation period in accordance with operation of the X-ray application switch and operation of the operation unit.
Public/Granted literature
- US20080212740A1 X-RAY DIAGNOSTIC APPARATUS AND X-RAY DIAGNOSTIC SYSTEM Public/Granted day:2008-09-04
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