Invention Grant
- Patent Title: Vibration test device
- Patent Title (中): 振动试验装置
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Application No.: US11871168Application Date: 2007-10-12
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Publication No.: US07726194B2Publication Date: 2010-06-01
- Inventor: Jun-Chao Ma
- Applicant: Jun-Chao Ma
- Applicant Address: CN Shenzhen, Guangdong Province TW Tu-Cheng, Taipei Hsien
- Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: CN Shenzhen, Guangdong Province TW Tu-Cheng, Taipei Hsien
- Agent Frank R. Niranjan
- Priority: CN200720200897U 20070829
- Main IPC: B06B3/00
- IPC: B06B3/00
Abstract:
A vibration test device for an electronic device(40) includes a test platform (10), and at least a pair of holders (20) attached to the platform. The test platform is capable of vibrating along any predetermined direction, and at any predetermined frequency. Each of the holders includes a pair of parallel base brackets(22) attached to the platform, and a mounting bracket(24) attached to the base brackets for mounting the electronic device. The holders and the electronic device are capable of vibrating together with the test platform.
Public/Granted literature
- US20090056458A1 VIBRATION TEST DEVICE Public/Granted day:2009-03-05
Information query
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