Invention Grant
- Patent Title: Magnetoresistance effect device and method of production thereof
- Patent Title (中): 磁阻效应装置及其制造方法
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Application No.: US12117753Application Date: 2008-05-09
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Publication No.: US07727409B2Publication Date: 2010-06-01
- Inventor: Hiroki Maehara , Tomoaki Osada , Mihoko Doi , Koji Tsunekawa , Naoki Watanabe
- Applicant: Hiroki Maehara , Tomoaki Osada , Mihoko Doi , Koji Tsunekawa , Naoki Watanabe
- Applicant Address: JP Kawasaki
- Assignee: Canon Anelva Corporation
- Current Assignee: Canon Anelva Corporation
- Current Assignee Address: JP Kawasaki
- Agency: Buchanan Ingersoll & Rooney PC
- Priority: JP2004-240838 20040820
- Main IPC: B44C1/22
- IPC: B44C1/22 ; G11B5/84

Abstract:
A method of production of a magnetoresistance effect device is able to prevent or minimize a drop in the MR ratio and maintain the high performance of the magnetoresistance effect device even if forming an oxide layer as a surface-most layer constituting a protective layer by the oxidation process inevitably included in the process of production of microprocessing by dry etching performed in a vacuum. Two mask layers used for microprocessing are doubly piled up. This method of production of a magnetoresistivity effect device including a magnetic multilayer film including at least two magnetic layers includes a step of providing under a first mask material that is a nonorganic material a second mask material able to react with other atoms to form a conductive substance, and a device made according to the method.
Public/Granted literature
- US20080217289A1 MAGNETORESISTANCE EFFECT DEVICE AND METHOD OF PRODUCTION THEREOF Public/Granted day:2008-09-11
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