Invention Grant
- Patent Title: Electron beam processing for mask repair
- Patent Title (中): 电子束处理面罩修复
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Application No.: US10758966Application Date: 2004-01-16
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Publication No.: US07727681B2Publication Date: 2010-06-01
- Inventor: Diane K. Stewart , J. David Casey, Jr. , John Beaty , Christian R. Musil , Steven Berger , Sybren J. Sijbrandij
- Applicant: Diane K. Stewart , J. David Casey, Jr. , Joan Williams Casey, legal representative , John Beaty , Christian R. Musil , Steven Berger , Sybren J. Sijbrandij
- Applicant Address: US OR Hillsboro
- Assignee: FEI Company
- Current Assignee: FEI Company
- Current Assignee Address: US OR Hillsboro
- Agency: Scheinberg & Griner, LLP
- Agent David Griner; Michael O. Scheinberg
- Main IPC: B01J19/08
- IPC: B01J19/08

Abstract:
Transmissivity is restored to a gallium stained substrate by directing an electron beam to the substrate in the presence of an etching gas. For higher concentrations of implanted gallium, the transparency can be substantially restored without reducing the thickness of the substrate. For lower doses of implanted gallium, the transmission is restored to 100%, although the thickness of the substrate is reduced. The invention is suitable for use in the repair of photolithography masks.
Public/Granted literature
- US20040226814A1 Electron beam processing for mask repair Public/Granted day:2004-11-18
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