Invention Grant
- Patent Title: Fabrication of aligned nanowire lattices
- Patent Title (中): 对准纳米线晶格的制作
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Application No.: US11842818Application Date: 2007-08-21
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Publication No.: US07727855B2Publication Date: 2010-06-01
- Inventor: Qingqiao Wei
- Applicant: Qingqiao Wei
- Applicant Address: US TX Houston
- Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee Address: US TX Houston
- Main IPC: H01L21/76
- IPC: H01L21/76

Abstract:
Methodologies associated with fabricating aligned nanowire lattices are described. One exemplary method embodiment includes providing a twist wafer bonded thin single crystal semiconductor film and a bulk single crystal substrate of the same material. Periodic non-uniform elastic strains present on the surface of the film control the positions where nanocrystals will form on the film. The strains may be removed via annealing and alloying after the formation of nanocrystal arrays.
Public/Granted literature
- US20080009121A1 Fabrication of Aligned Nanowire Lattices Public/Granted day:2008-01-10
Information query
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