Invention Grant
- Patent Title: Device under test pogo pin type contact element
- Patent Title (中): 被测器件被测针头类型接触元件
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Application No.: US11975043Application Date: 2007-10-17
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Publication No.: US07728613B2Publication Date: 2010-06-01
- Inventor: Gerard Blaney , John Grubb , Niall Nolan
- Applicant: Gerard Blaney , John Grubb , Niall Nolan
- Applicant Address: US MA Norwood
- Assignee: Analog Devices, Inc.
- Current Assignee: Analog Devices, Inc.
- Current Assignee Address: US MA Norwood
- Agency: Sunstein Kann Murphy & Timbers LLP
- Main IPC: G01R31/02
- IPC: G01R31/02
Abstract:
A device under test pogo pin type contactor features an active head and an electronic component associated with the active head. A tip is spaced from the active head and a biasing device is between the active head and the tip for biasing the active head against a device under test.
Public/Granted literature
- US20080116924A1 Device under test pogo pin type contact element Public/Granted day:2008-05-22
Information query
