Invention Grant
- Patent Title: Enhanced detection system and method
- Patent Title (中): 增强检测系统和方法
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Application No.: US12027961Application Date: 2008-02-07
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Publication No.: US07728974B2Publication Date: 2010-06-01
- Inventor: Gerrit van den Engh
- Applicant: Gerrit van den Engh
- Applicant Address: US WA Seattle
- Assignee: Cytopeia, Inc.
- Current Assignee: Cytopeia, Inc.
- Current Assignee Address: US WA Seattle
- Agent Douglas A. Petry
- Main IPC: G01N21/00
- IPC: G01N21/00

Abstract:
An enhanced detection system can eliminate use of a sheath fluid by selecting which particles that pass through an sensing region to detect parametric characteristics thereof based upon position of each particle while it is in a sensing region relative to one or more predetermined positions, such as an in-focus position relative to one or more light beams directed into the sensing region, to enhance accuracy and robustness of particle parametric characteristics detection.
Public/Granted literature
- US20080186479A1 ENHANCED DETECTION SYSTEM AND METHOD Public/Granted day:2008-08-07
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