Invention Grant
US07728974B2 Enhanced detection system and method 有权
增强检测系统和方法

  • Patent Title: Enhanced detection system and method
  • Patent Title (中): 增强检测系统和方法
  • Application No.: US12027961
    Application Date: 2008-02-07
  • Publication No.: US07728974B2
    Publication Date: 2010-06-01
  • Inventor: Gerrit van den Engh
  • Applicant: Gerrit van den Engh
  • Applicant Address: US WA Seattle
  • Assignee: Cytopeia, Inc.
  • Current Assignee: Cytopeia, Inc.
  • Current Assignee Address: US WA Seattle
  • Agent Douglas A. Petry
  • Main IPC: G01N21/00
  • IPC: G01N21/00
Enhanced detection system and method
Abstract:
An enhanced detection system can eliminate use of a sheath fluid by selecting which particles that pass through an sensing region to detect parametric characteristics thereof based upon position of each particle while it is in a sensing region relative to one or more predetermined positions, such as an in-focus position relative to one or more light beams directed into the sensing region, to enhance accuracy and robustness of particle parametric characteristics detection.
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