Invention Grant
US07728979B2 Method and device for characterizing analyte using electro-optically modulated surface plasmon resonance based on phase detection
失效
基于相位检测使用电光调制表面等离子体共振来表征分析物的方法和装置
- Patent Title: Method and device for characterizing analyte using electro-optically modulated surface plasmon resonance based on phase detection
- Patent Title (中): 基于相位检测使用电光调制表面等离子体共振来表征分析物的方法和装置
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Application No.: US11749142Application Date: 2007-05-15
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Publication No.: US07728979B2Publication Date: 2010-06-01
- Inventor: Tzyy-Jiann Wang , Chih-Wuei Hsieh
- Applicant: Tzyy-Jiann Wang , Chih-Wuei Hsieh
- Applicant Address: TW Taipei
- Assignee: National Taipei University Technology
- Current Assignee: National Taipei University Technology
- Current Assignee Address: TW Taipei
- Agent Chun-Ming Shih
- Main IPC: G01N21/55
- IPC: G01N21/55

Abstract:
A method and a device for detecting object properties using electro-optically modulated surface plasmon resonance (SPR) based on phase detection is disclosed. In the case of a surface plasmon resonance sensing device according to the present invention, the voltage is applied on the sensing device made of an electro-optic material to modulate the surface plasmon resonance condition by varying the wavevector of the incident lightwave. The relation between the phase of output optical wave and the applied voltage is measured, and the solution concentration or the material property is obtained by using the slope of a regression straight line of this relations. The invention can be used in the experimental arrangements of the attenuated-total-reflection (ATR) structure and the optical waveguide structure, and has advantages of high sensitivity, high stability, small bulk, low equipment cost, etc.
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