Invention Grant
- Patent Title: Method and apparatus for testing conic optical surfaces
- Patent Title (中): 用于测试圆锥光学表面的方法和装置
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Application No.: US12018859Application Date: 2008-01-24
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Publication No.: US07728988B2Publication Date: 2010-06-01
- Inventor: William Conrad Stenton
- Applicant: William Conrad Stenton
- Applicant Address: US MA Waltham
- Assignee: Raytheon Company
- Current Assignee: Raytheon Company
- Current Assignee Address: US MA Waltham
- Agency: Haynes and Boone, LLP
- Main IPC: G01B11/02
- IPC: G01B11/02 ; G02B5/08

Abstract:
According to one aspect, a part has two reflective surfaces, one being a conic surface portion having an axis with a focus thereon, and the other being part of a spherical surface with a centerpoint at the focus. According to a different aspect, a method includes fabricating a part with first and second reflective surfaces, the first being a conic surface portion with an axis and a focus on the axis, and the second being a spherical surface portion with a centerpoint at the focus. The second surface is used to position the part so that the focus coincides with the centerpoint of a spherical wave from an interferometer. Then, a reflective further spherical surface portion on a member is used with the interferometer to position a centerpoint of the further surface at the focus. The interferometer then evaluates the first surface for accuracy.
Public/Granted literature
- US20090190137A1 Method and Apparatus for Testing Conic Optical Surfaces Public/Granted day:2009-07-30
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