Invention Grant
- Patent Title: Inspection apparatus, analysis display apparatus, inspection system and inspection method
- Patent Title (中): 检验仪器,分析显示装置,检查系统和检验方法
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Application No.: US11579957Application Date: 2005-04-28
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Publication No.: US07729692B2Publication Date: 2010-06-01
- Inventor: Hitoshi Oka , Yukinori Amao , Yojiro Hiranuma , Taiji Katsube
- Applicant: Hitoshi Oka , Yukinori Amao , Yojiro Hiranuma , Taiji Katsube
- Applicant Address: JP Osaka JP Osaka
- Assignee: Panasonic Corporation,Agilent Technologies, Inc.
- Current Assignee: Panasonic Corporation,Agilent Technologies, Inc.
- Current Assignee Address: JP Osaka JP Osaka
- Agency: Dickinson Wright PLLC
- Priority: JP2004-142094 20040512
- International Application: PCT/JP2005/008197 WO 20050428
- International Announcement: WO2005/109685 WO 20051117
- Main IPC: G01R31/02
- IPC: G01R31/02

Abstract:
There is provided an inspection system capable of easily performing inspection of a radio section under an actual environment and enabling a user to easily identify a trouble. In this system, an analysis/display device (400) analyzes the data outputted from an inspection device (200, 300) and extracts a radio parameter. By using the radio parameter extracted from the data obtained by inspection of a cabled section, an inspection device (100) inspects the state of radio communication between a communication terminal device (50) and abase station device (150). The analysis/display device (400) aligns the cabled message and the radio message obtained by analyzing the data outputted from the inspection devices (100, 200, 300) in time series or in sequence of calls and displays them.
Public/Granted literature
- US20080191708A1 Inspection Device, Analysis/Display Device, Inspection Device Public/Granted day:2008-08-14
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