Invention Grant
- Patent Title: Phase error determination method and digital phase-locked loop system
- Patent Title (中): 相位误差确定方法和数字锁相环系统
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Application No.: US10882121Application Date: 2004-06-30
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Publication No.: US07730366B2Publication Date: 2010-06-01
- Inventor: Shinobu Nakamura , Mamoru Kudo , Satoru Ooshima , Jun Yamane , Hirofumi Shimizu
- Applicant: Shinobu Nakamura , Mamoru Kudo , Satoru Ooshima , Jun Yamane , Hirofumi Shimizu
- Applicant Address: JP Tokyo
- Assignee: Sony Corporation
- Current Assignee: Sony Corporation
- Current Assignee Address: JP Tokyo
- Agency: Rockey, Depke & Lyons, LLC
- Agent Robert J. Depke
- Priority: JP2003-190302 20030702
- Main IPC: G11B5/00
- IPC: G11B5/00 ; G11B20/20

Abstract:
In a digital PLL system, instead of measuring a binarized playback RF signal with a high frequency clock, pulse-length data is generated by using N phase clocks (for example, 16 phase clocks). The pulse-length data is then counted with a virtual channel clock so as to extract run-length data. In this digital PLL system, the number of changing points of an asynchronous signal during an interval between adjacent clocks of the N phase clocks is detected so as to determine phase errors from the detected number of changing points. Phase errors are also determined from the timing relationship between changing points of a signal synchronized with the N phase clocks and each clock of the N phase clocks.
Public/Granted literature
- US20050022076A1 Phase error determination method and digital phase-locked loop system Public/Granted day:2005-01-27
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