Invention Grant
- Patent Title: Test access control for secure integrated circuits
- Patent Title (中): 测试安全集成电路的访问控制
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Application No.: US11134514Application Date: 2005-05-23
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Publication No.: US07730545B2Publication Date: 2010-06-01
- Inventor: George James Milne , Andrew Brookfield Swaine , Donald Felton
- Applicant: George James Milne , Andrew Brookfield Swaine , Donald Felton
- Applicant Address: GB Cambridge
- Assignee: ARM Limited
- Current Assignee: ARM Limited
- Current Assignee Address: GB Cambridge
- Agency: Nixon & Vanderhye P.C.
- Main IPC: G06F7/04
- IPC: G06F7/04 ; G06F11/00
Abstract:
Test access to an integrated circuit 2 is controlled by the use of test access enabling keys. A plurality of different test access enabling levels may be supported corresponding to different keys. The test access control may be performed by dedicated hardware or software executing a secure privilege mode.
Public/Granted literature
- US20060282734A1 Test access control for secure integrated circuits Public/Granted day:2006-12-14
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