Invention Grant
- Patent Title: Structural surface measuring and aligning apparatus and method
- Patent Title (中): 结构表面测量及对位装置及方法
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Application No.: US11498664Application Date: 2006-08-02
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Publication No.: US07730622B2Publication Date: 2010-06-08
- Inventor: Kerry McCauley
- Applicant: Kerry McCauley
- Agency: Jordan and Hamburg LLP
- Main IPC: E04F21/00
- IPC: E04F21/00 ; E04B2/82

Abstract:
An apparatus and method provide for measurement at various positions over an extent of an uneven structural surface, and preparation of spacers, cut to appropriate thicknesses based upon such measurements, such that when affixed to the respective measurement locations, outer facing surfaces of the spacers are collectively coplanar. A method of aligning a surface includes defining a reference plane in a fixed condition relative to the structural surface, and determining a differential distance between the structural surface and the reference plane at various locations along an extend of the particular structural surface. Using these measurements, indexed according to location, spacers are cut to a thickness based upon the respective differential distances at corresponding locations, which, when mounted to the structural surface at these recorded locations, results in alignment of outwardly facing surfaces with a common plane. Advantageously, at least a portion of the processes is automated.
Public/Granted literature
- US20080028693A1 Panel installation system Public/Granted day:2008-02-07
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