Invention Grant
- Patent Title: Layered beam measurement apparatus
- Patent Title (中): 分层光束测量装置
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Application No.: US11556381Application Date: 2006-11-03
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Publication No.: US07730630B1Publication Date: 2010-06-08
- Inventor: Brian Lamb , David Titzler , Heather Fleming
- Applicant: Brian Lamb , David Titzler , Heather Fleming
- Applicant Address: US CA Mountain View
- Assignee: Design to Manufacturing, Inc.
- Current Assignee: Design to Manufacturing, Inc.
- Current Assignee Address: US CA Mountain View
- Agent Jeffrey Schox
- Main IPC: G01B3/10
- IPC: G01B3/10

Abstract:
A new and improved tape rule that increases stiffness and standout length over standard tape rules is disclosed. The tape rule includes a primary rule and a secondary rule, the secondary rule providing increased strength. This invention can provide a variety of benefits, including increased blade flexibility while performing short extension related tasks, increased standout and reduced sag while performing tasks requiring longer extensions, reduced size and weight for tasks requiring the longest extensions and adds the ability to utilize alternate measurement methods or units and built in computational references.
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