Invention Grant
- Patent Title: Device and method for testing isolation structure
- Patent Title (中): 隔离结构测试装置及方法
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Application No.: US12207591Application Date: 2008-09-10
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Publication No.: US07730762B2Publication Date: 2010-06-08
- Inventor: Chang Xia
- Applicant: Chang Xia
- Agency: Matthias Scholl P.C.
- Agent Matthias Scholl
- Priority: CN200710009508 20070912
- Main IPC: G01M19/00
- IPC: G01M19/00 ; G01M7/06 ; G01N3/30 ; G01L5/00

Abstract:
Provided is a device for testing an isolation structure comprising an isolation layer having an upper beam, a lower beam and a top beam plate, along with an upper portion, the device comprising a plurality of upper corbels, a plurality of lower corbels, a plurality of hoisting jacks, a plurality of acceleration sensors, a plurality of displacement sensors, an acceleration collecting analyzer and a displacement collecting analyzer. A method for testing an isolation structure is also provided.
Public/Granted literature
- US20090064798A1 DEVICE AND METHOD FOR TESTING ISOLATION STRUCTURE Public/Granted day:2009-03-12
Information query