Invention Grant
US07730789B2 Device and method for measuring a gap between members of a structure for manufacture of a shim
有权
用于测量用于制造垫片的结构的构件之间的间隙的装置和方法
- Patent Title: Device and method for measuring a gap between members of a structure for manufacture of a shim
- Patent Title (中): 用于测量用于制造垫片的结构的构件之间的间隙的装置和方法
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Application No.: US11555315Application Date: 2006-11-01
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Publication No.: US07730789B2Publication Date: 2010-06-08
- Inventor: David J. Odendahl
- Applicant: David J. Odendahl
- Applicant Address: US WA Seattle
- Assignee: Boeing Management Company
- Current Assignee: Boeing Management Company
- Current Assignee Address: US WA Seattle
- Agency: Weiss & Moy, P.C.
- Main IPC: G01B7/16
- IPC: G01B7/16
Abstract:
An apparatus for measuring a gap between a first mating surface of a first component and a second mating surface of a second component has a substrate. A plurality of capacitive sensors is coupled to the substrate. A controller is coupled to the plurality of capacitive sensors. The controller is used to select each individual capacitive sensor to measure the gap between the first mating surface of the first component and the second mating surface of the second component.
Public/Granted literature
- US20080110275A1 DEVICE AND METHOD FOR MEASURING A GAP BETWEEN MEMBERS OF A STRUCTURE FOR MANUFACTURE OF A SHIM Public/Granted day:2008-05-15
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