A fuse link of undoped material is connected between first and second doped material contact regions and a layer of conductive material is located above the first and second contact regions and the fuse link. According to other embodiments, a fuse link is connected between first and second contact regions. A layer of conductive material is above the first and second contact regions and the fuse link, and a heat sink is in proximity to the fuse link. In a method, a programming pulse is applied to a fuse link of undoped material connected between first and second doped material contact regions to generate electromigration drift of a conductive material above the first and second contact regions and the fuse link.