Invention Grant
US07733078B2 Self-test probe design & method for non-contact voltage detectors
有权
非接触电压检测器的自检探头设计与方法
- Patent Title: Self-test probe design & method for non-contact voltage detectors
- Patent Title (中): 非接触电压检测器的自检探头设计与方法
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Application No.: US11897867Application Date: 2007-08-31
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Publication No.: US07733078B2Publication Date: 2010-06-08
- Inventor: Richard A. Duke
- Applicant: Richard A. Duke
- Applicant Address: US IL Rockford
- Assignee: Greenlee Textron, Inc.
- Current Assignee: Greenlee Textron, Inc.
- Current Assignee Address: US IL Rockford
- Agency: Pillsbury Winthrop Shaw Pittman LLP
- Main IPC: G01R31/02
- IPC: G01R31/02

Abstract:
A non-contact voltage detector having a self-test feature is provided. The non-contact voltage detector may include an antenna, a detection circuit and a self-test circuit. The self-test circuit may be configured to send a test signal through a portion of the antenna and to the detection circuit. Alternatively, the self-test circuit may be configured to send a test signal to the detection circuit without sending it through a portion of the antenna.
Public/Granted literature
- US20080054882A1 Self-test probe design & method for non-contact voltage detectors Public/Granted day:2008-03-06
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