Invention Grant
- Patent Title: Automated test equipment interface
- Patent Title (中): 自动化测试设备接口
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Application No.: US11875627Application Date: 2007-10-19
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Publication No.: US07733081B2Publication Date: 2010-06-08
- Inventor: Vladimir Vayner , Brian Donovan
- Applicant: Vladimir Vayner , Brian Donovan
- Applicant Address: US MA North Reading
- Assignee: Teradyne, Inc.
- Current Assignee: Teradyne, Inc.
- Current Assignee Address: US MA North Reading
- Agency: Fish & Richardson P.C.
- Main IPC: G01R31/28
- IPC: G01R31/28

Abstract:
An automated test equipment interface system, e.g., for attaching a handler to a test head, includes a device interface board assembly. The device interface board assembly includes a stiffener frame having a frame body that is configured for attachment to a test head, alignment brackets connected to the frame body, and cam followers connected to the alignment brackets. The system also includes a docking device. The docking device includes a docking plate that is configured for attachment to a handler, pull-down ramps connected to the docking plate and movable between a retracted position and an extended position, an actuator operable to initiate movement of the pull-down ramps, and a coupling that translates movement of the actuator to corresponding movements of the pull-down ramps. The pull-down ramps can include cam surfaces that are configured to engage the cam followers of the device interface board assembly during movement between the retracted and extended positions to pull the device interface board assembly towards the docking plate.
Public/Granted literature
- US20090102457A1 Automated Test Equipment Interface Public/Granted day:2009-04-23
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