Invention Grant
- Patent Title: Semiconductor device and operating method thereof
- Patent Title (中): 半导体器件及其操作方法
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Application No.: US12217002Application Date: 2008-06-30
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Publication No.: US07733141B2Publication Date: 2010-06-08
- Inventor: Young-Hoon Oh
- Applicant: Young-Hoon Oh
- Applicant Address: KR
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR
- Agency: Blakely, Sokoloff, Taylor & Zafman
- Priority: KR10-2007-0111458 20071102; KR10-2008-0040893 20080430
- Main IPC: H03L7/06
- IPC: H03L7/06

Abstract:
A delay locked loop (DLL) of a semiconductor device has a relatively small area and low current consumption while having a function of correcting a duty ratio. The semiconductor device includes a split unit configured to receive and split a reference clock to output a first clock corresponding to a first edge of the reference clock and a second clock corresponding to a second edge, a voltage generation unit configured to generate a first voltage corresponding to a duty ratio of the first clock and a second voltage corresponding to a duty ratio of the second clock, a voltage comparison unit configured to compare levels of the first and second voltages with each other, and a clock delay unit configured to receive one of the first and second clocks to delay the received clock of which delay amount is determined in response to an output signal of the voltage comparison unit.
Public/Granted literature
- US20090115475A1 Semiconductor device and operating method thereof Public/Granted day:2009-05-07
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