Invention Grant
- Patent Title: Semiconductor device with decoupling capacitance controlled and control method for the same
- Patent Title (中): 具有去耦电容的半导体器件控制和控制方法相同
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Application No.: US11847768Application Date: 2007-08-30
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Publication No.: US07733164B2Publication Date: 2010-06-08
- Inventor: Takashi Umamichi , Katsunori Shirai
- Applicant: Takashi Umamichi , Katsunori Shirai
- Applicant Address: JP Kanagawa
- Assignee: NEC Electronics Corporation
- Current Assignee: NEC Electronics Corporation
- Current Assignee Address: JP Kanagawa
- Agency: Sughrue Mion, PLLC
- Priority: JP2006-237698 20060901
- Main IPC: H03B1/00
- IPC: H03B1/00 ; H03K5/00 ; H04B1/10
Abstract:
In a semiconductor device, a monitoring circuit monitors and detects a quantity of noise in the semiconductor device. A control circuit has capacitances and controls connections to the capacitances such a decoupling capacitance value provided between a first power supply and a second power supply is dynamically adjusted based on the detected noise quantity.
Public/Granted literature
- US20080055018A1 SEMICONDUCTOR DEVICE WITH DECOUPLING CAPACITANCE CONTROLLED AND CONTROL METHOD FOR THE SAME Public/Granted day:2008-03-06
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