Invention Grant
- Patent Title: Lens meter
- Patent Title (中): 镜头表
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Application No.: US12071260Application Date: 2008-02-19
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Publication No.: US07733468B2Publication Date: 2010-06-08
- Inventor: Tadashi Kajino
- Applicant: Tadashi Kajino
- Applicant Address: JP Gamagori
- Assignee: Nidek Co., Ltd.
- Current Assignee: Nidek Co., Ltd.
- Current Assignee Address: JP Gamagori
- Agency: Oliff & Berridge PLC
- Priority: JP2007-050813 20070228; JP2008-025638 20080205
- Main IPC: G01B9/00
- IPC: G01B9/00

Abstract:
A lens meter capable of obtaining optical characteristics of a lens with high stability and accuracy has a measurement optical system including a target panel having measurement targets having first measurement targets and second measurement targets and a photodetector which photo-receives a measurement light bundle, a calculation means which calculates the optical characteristics including first calculation means which calculates first optical characteristics based on a detection result of the first measurement targets by the photodetector and second calculation means which calculates second optical characteristics based on a detection result of the first and second measurement targets, and display control means which displays the second optical characteristics as the optical characteristics of the lens if the calculation result by the first calculation means or the detection result by the photodetector satisfies a predetermined condition and displays the first optical characteristics if the predetermined condition is not satisfied.
Public/Granted literature
- US20080204727A1 Lens meter Public/Granted day:2008-08-28
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