Invention Grant
- Patent Title: Self testing digital fault interrupter
- Patent Title (中): 自检数字故障断路器
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Application No.: US11198400Application Date: 2005-08-08
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Publication No.: US07733617B2Publication Date: 2010-06-08
- Inventor: John R. Baldwin , Sorin I. Mortun , Daming Yu
- Applicant: John R. Baldwin , Sorin I. Mortun , Daming Yu
- Applicant Address: US CT Orange
- Assignee: Hubbell Incorporated
- Current Assignee: Hubbell Incorporated
- Current Assignee Address: US CT Orange
- Agent Mark S. Bicks; Alfred N. Goodman; Kevin M. Barner
- Main IPC: H02H3/00
- IPC: H02H3/00

Abstract:
A self testing fault detector having a line side and a load side and a conductive path there between. The apparatus includes a solenoid, which is adapted to move a plurality of contacts disposed in the conductive path from a first position to a second position when the self testing device is powered from the line side; and a processor, which is adapted to energize the solenoid using a first switch and maintain said solenoid in the energized state using a second switch.
Public/Granted literature
- US20070030608A1 Self testing digital fault interrupter Public/Granted day:2007-02-08
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