Invention Grant
US07733720B2 Method and system for determining element voltage selection control values for a storage device
失效
用于确定存储设备的元件电压选择控制值的方法和系统
- Patent Title: Method and system for determining element voltage selection control values for a storage device
- Patent Title (中): 用于确定存储设备的元件电压选择控制值的方法和系统
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Application No.: US11941161Application Date: 2007-11-16
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Publication No.: US07733720B2Publication Date: 2010-06-08
- Inventor: Rajiv V. Joshi , Jente B Kuang , Rouwaida N. Kanj , Sani R. Nassif , Hung Cai Ngo
- Applicant: Rajiv V. Joshi , Jente B Kuang , Rouwaida N. Kanj , Sani R. Nassif , Hung Cai Ngo
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Mitch Harris, Atty at Law, LLC
- Agent Andrew M. Harris; Libby Z. Toub
- Main IPC: G11C29/00
- IPC: G11C29/00

Abstract:
A method and system for determining element voltage selection control values for a storage device provides energy conservation in storage arrays while maintaining a particular performance level. The storage device is partitioned into multiple elements, which may be sub-arrays, rows, columns or individual storage cells. Each element has a corresponding virtual power supply rail that is provided with a selectable power supply voltage. At test time, digital control values are determined for selection circuits for each element that set the virtual power supply rail to the minimum power supply voltage, unless a higher power supply voltage is required for the element to meet performance requirements. The set of digital control values can then be programmed into a fuse or used to adjust a mask at manufacture, or supplied on media along with the storage device and loaded into the device at system initialization.
Public/Granted literature
- US20090132873A1 Method and System for Determining Element Voltage Selection Control Values for a Storage Device Public/Granted day:2009-05-21
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