Invention Grant
- Patent Title: Shape measuring device and method
- Patent Title (中): 形状测量装置及方法
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Application No.: US12171453Application Date: 2008-07-11
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Publication No.: US07734445B2Publication Date: 2010-06-08
- Inventor: Mahito Negishi
- Applicant: Mahito Negishi
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Fitzpatrick, Cella, Harper & Scinto
- Priority: JP2007-185623 20070717
- Main IPC: G01B5/012
- IPC: G01B5/012

Abstract:
A device measures a measurement object surface shape, and includes a base to which the measurement object is secured; a slide movable in at least three different directions and secured to the base; a probe holding unit mounted to the slide; and a contact probe resiliently supported by the holding unit so as to be movable with respect to the holding unit. Additional features include a unit measuring the position and posture of the probe with respect to the holding unit; a unit calculating a contact-force vector, which the probe receives from the measurement object, from a measurement result of the measuring unit; and a controlling unit moving the probe along the surface of the measurement object. The controlling unit also controls a position of the holding unit so that a magnitude of the contact-force vector comes closer to a control target value thereof in accordance with the magnitude of the contact-force vector.
Public/Granted literature
- US20090024355A1 SHAPE MEASURING DEVICE AND METHOD Public/Granted day:2009-01-22
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