Invention Grant
- Patent Title: Common test logic for multiple operation modes
- Patent Title (中): 多种操作模式的通用测试逻辑
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Application No.: US12010000Application Date: 2008-01-23
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Publication No.: US07734972B2Publication Date: 2010-06-08
- Inventor: Talal Jaber , David M. Wu , Ming Zhang
- Applicant: Talal Jaber , David M. Wu , Ming Zhang
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Trop, Pruner & Hu, P.C.
- Main IPC: G01R31/28
- IPC: G01R31/28

Abstract:
In one embodiment, the present invention includes a processor having a plurality of logical units to perform operations on data. Each unit may include a multiple input shift register (MISR) at an input of the logical unit to collect and compress data from input signals to the unit. In turn, each MISR may includes bit cells, each having a first cell to receive incoming data and controlled by a first clock signal, a second cell to receive an output of the first cell and controlled by a second clock signal, a mask cell to receive an output of the second cell and to generate a mask signal responsive to a mask clock signal, and a multiplexer coupled between the first and second cells. Other embodiments are described and claimed.
Public/Granted literature
- US20090187799A1 Common test logic for multiple operation modes Public/Granted day:2009-07-23
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