Invention Grant
US07734985B2 Systems, methods, and apparatuses for using the same memory type to support an error check mode and a non-error check mode
失效
使用相同存储器类型来支持错误检查模式和非错误检查模式的系统,方法和装置
- Patent Title: Systems, methods, and apparatuses for using the same memory type to support an error check mode and a non-error check mode
- Patent Title (中): 使用相同存储器类型来支持错误检查模式和非错误检查模式的系统,方法和装置
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Application No.: US11364107Application Date: 2006-02-27
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Publication No.: US07734985B2Publication Date: 2010-06-08
- Inventor: Kuljit S. Bains
- Applicant: Kuljit S. Bains
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Blakely, Sokoloff, Taylor & Zafman LLP
- Main IPC: G11C29/00
- IPC: G11C29/00

Abstract:
Embodiments of the invention are generally directed to systems, methods, and apparatuses for using the same memory type in an error check mode and a non-error check mode. In some embodiments, a memory device includes at least one split bank pair of memory banks. If the memory device is in an error check mode, then, in some embodiments, data is stored in one of memory banks of the split bank pair and the corresponding error check bits are stored in the other memory bank of the split bank pair. A register bit on the memory device indicates whether it is in the error check mode or the non-error check mode. Other embodiments are described and claimed.
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