Invention Grant
- Patent Title: Method for puncturing a low density parity check code
- Patent Title (中): 打孔低密度奇偶校验码的方法
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Application No.: US11541749Application Date: 2006-10-02
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Publication No.: US07734988B2Publication Date: 2010-06-08
- Inventor: Dong-Ho Kim , Yung-Soo Kim , Ye-Hoon Lee , Myeon-Gyun Cho , Hyo-Yol Park , Keum-Chan Whang , Kwang-Soon Kim , Jae-Won Kang
- Applicant: Dong-Ho Kim , Yung-Soo Kim , Ye-Hoon Lee , Myeon-Gyun Cho , Hyo-Yol Park , Keum-Chan Whang , Kwang-Soon Kim , Jae-Won Kang
- Applicant Address: KR KR
- Assignee: Samsung Electronics Co., Ltd,Yonsei University
- Current Assignee: Samsung Electronics Co., Ltd,Yonsei University
- Current Assignee Address: KR KR
- Agency: The Farrell Law Firm, LLP
- Priority: KR2005-0092573 20050930
- Main IPC: H03M13/35
- IPC: H03M13/35

Abstract:
A method for puncturing a Low Density Parity Check (LDPC). The method includes a) setting a codeword length and the total number of bit nodes to be punctured; b) selecting a check node (or check nodes) with highest priority excluding check nodes completely checked in a current round; c) selecting a bit node (or bit nodes) with a highest priority excluding bit nodes completely checked among bit nodes connected to the selected check node (or check nodes); d) determining whether the selected bit node is a bit node to be punctured, that is, it is not systematic, not set by a puncturing prohibition flag; e) puncturing an associated bit node if the selected bit node is the bit node to be punctured, setting unpunctured bit nodes connected to the selected check node by a puncturing prohibition flag, decreasing the number of remained bit nodes to be punctured by 1 and increasing the number of connected punctured node of associated check node by 1; f) determining whether the number of remaining bits to be punctured is greater than 0; and g) returning to step b) if the number of remaining bits to be punctured is greater than 0, and ending a puncturing process if the number of remaining bits to be punctured is not greater than 0.
Public/Granted literature
- US20070101243A1 Method for puncturing a low density parity check code Public/Granted day:2007-05-03
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