Invention Grant
- Patent Title: Apparatus and methods for performing a test
- Patent Title (中): 用于进行测试的装置和方法
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Application No.: US12337353Application Date: 2008-12-17
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Publication No.: US07741863B2Publication Date: 2010-06-22
- Inventor: Johann Peter Forstner
- Applicant: Johann Peter Forstner
- Applicant Address: DE Munich
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Munich
- Agency: Eschweiler & Associates, LLC
- Priority: DE102006024460 20060524
- Main IPC: G01R31/26
- IPC: G01R31/26
Abstract:
A circuit structure has a circuit portion with negative resistance and a test resonator structure. Furthermore, the circuit structure has a unit for coupling the test resonator structure to the circuit portion with negative resistance during testing and for decoupling the test resonator structure from the circuit portion with negative resistance after testing.
Public/Granted literature
- US20090096477A1 APPARATUS AND METHODS FOR PERFORMING A TEST Public/Granted day:2009-04-16
Information query
