Invention Grant
US07742563B2 X-ray source and detector configuration for a non-translational x-ray diffraction system
失效
用于非平移x射线衍射系统的X射线源和检测器配置
- Patent Title: X-ray source and detector configuration for a non-translational x-ray diffraction system
- Patent Title (中): 用于非平移x射线衍射系统的X射线源和检测器配置
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Application No.: US12207641Application Date: 2008-09-10
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Publication No.: US07742563B2Publication Date: 2010-06-22
- Inventor: Peter Michael Edic , Geoffrey Harding , Bruno K. B. De Man , Helmut Rudolf Strecker
- Applicant: Peter Michael Edic , Geoffrey Harding , Bruno K. B. De Man , Helmut Rudolf Strecker
- Applicant Address: US CA Newark
- Assignee: Morpho Detection, Inc.
- Current Assignee: Morpho Detection, Inc.
- Current Assignee Address: US CA Newark
- Agency: Armstrong Teasdale LLP
- Main IPC: G01N23/20
- IPC: G01N23/20 ; G01N23/04

Abstract:
A system and method for scanning objects using a non-translational x-ray diffraction (XRD) system is disclosed. The system includes a scanning area through which an object to be scanned traverses and a distributed x-ray source having a plurality of focal spot locations. The distributed x-ray source is affixed on the scanning area and is configured to emit x-rays towards the object as a series of parallel x-ray beams. A stationary detector arrangement is affixed on another side of the scanning area generally opposite the distributed x-ray source and is configured to measure a coherent scatter spectra of the x-rays after passing through the object. A data acquisition system (DAS) is connected to the detector arrangement and is configured to measure the coherent scatter spectra, which is utilized to generate XRD data and determine a material composition of at least a portion of the object from the XRD data.
Public/Granted literature
- US20100061512A1 X-RAY SOURCE AND DETECTOR CONFIGURATION FOR A NON-TRANSLATIONAL X-RAY DIFFRACTION SYSTEM Public/Granted day:2010-03-11
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