Invention Grant
- Patent Title: Calibrating an optical FMCW backscattering measurement system
- Patent Title (中): 校准光学FMCW后向散射测量系统
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Application No.: US11574575Application Date: 2005-09-07
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Publication No.: US07742892B2Publication Date: 2010-06-22
- Inventor: Martin Fromme , Ulrich Glombitza
- Applicant: Martin Fromme , Ulrich Glombitza
- Applicant Address: DE Cologne
- Assignee: Lios Technology GmbH
- Current Assignee: Lios Technology GmbH
- Current Assignee Address: DE Cologne
- Agent Laurence A. Greenberg; Werner H. Stemer; Ralph E. Locher
- Priority: DKPA200401381 20040910
- International Application: PCT/EP2005/054418 WO 20050907
- International Announcement: WO2006/027369 WO 20060316
- Main IPC: G01D18/00
- IPC: G01D18/00 ; G01J3/00

Abstract:
The object of the invention is to provide a method of calibrating an optical FMCW backscattering measurement system that improves the precision of the measurement. The problem is solved by a method comprising the steps of A. Converting said received sensor signal to a complex received electrical signal as a function of said modulation frequency fm, said complex received electrical signal being represented by a magnitude part and a phase angle part as a function of said modulation frequency fm; B. Performing a transformation of said received electrical signal to provide a backscattering signal as a function of location between said first and second ends of said sensor and beyond said second end; C. From said backscattering signal as a function of location determining characteristics of a curve representative of said backscattering signal beyond said second end; D. Correcting said magnitude part of said received electrical signal and said phase angle part of said received electrical signal in a predetermined dependence of said curve; and E. Repeating step B) on the basis of the corrected received electrical signal.
Public/Granted literature
- US20090240455A1 Calibrating An Optical FMCW Backscattering Measurement System Public/Granted day:2009-09-24
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