Invention Grant
US07742896B2 Measured value transformation method and measured value transformation system 有权
测量值变换方法和测量值转换系统

  • Patent Title: Measured value transformation method and measured value transformation system
  • Patent Title (中): 测量值变换方法和测量值转换系统
  • Application No.: US11718200
    Application Date: 2005-10-27
  • Publication No.: US07742896B2
    Publication Date: 2010-06-22
  • Inventor: Takanori Ikegami
  • Applicant: Takanori Ikegami
  • Agency: Ostrolenk Faber LLP
  • Priority: JPP2004-344916 20041030; JPP2005-151553 20050421; JPP2005-243388 20050729
  • International Application: PCT/JP2005/019813 WO 20051027
  • International Announcement: WO2006/049084 WO 20060511
  • Main IPC: G06F17/00
  • IPC: G06F17/00 G01D1/00
Measured value transformation method and measured value transformation system
Abstract:
A plurality of first measured values (xi) are obtained by respectively measuring a plurality of measuring objects in a plurality of first measuring systems and a plurality of second measured values (yi) are obtained by respectively measuring the plurality of measuring objects in a plurality of second measuring systems, and a combination of a first measured value and a second measured value corresponding to each other is obtained as a sample point (Pi). A transformation function representing a relationship between a first reconstituted system derived from the plurality of first measuring systems and a second reconstituted system derived from the plurality of second measuring system is obtained statistically processing a plurality of sample points of the plurality of measuring objects. Subsequently, a transformed value (τi) is obtained by transforming a second measured value (yi) with the transformation function.
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