Invention Grant
- Patent Title: Leakage compensation for sample and hold devices
- Patent Title (中): 采样和保持设备的泄漏补偿
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Application No.: US12233463Application Date: 2008-09-18
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Publication No.: US07746119B2Publication Date: 2010-06-29
- Inventor: Zhao-Jun Wang
- Applicant: Zhao-Jun Wang
- Applicant Address: US CA San Jose
- Assignee: Power Integrations, Inc.
- Current Assignee: Power Integrations, Inc.
- Current Assignee Address: US CA San Jose
- Agency: Blakely Sokoloff Taylor & Zafman, LLP
- Main IPC: G11C27/02
- IPC: G11C27/02

Abstract:
A sample and hold circuit in one aspect includes first and second switches. The first switch can be coupled to receive an input signal and to sample the input signal using a first capacitor. A first leakage current flows between first and second conductive terminals of the first switch and accumulates as a first leakage charge in the first capacitor. A second leakage current flows between the first and second conductive terminals of the second switch and accumulates as a second leakage charge in the second capacitor. An offset circuit produces a compensated sampled value by subtracting a quantity from a signal developed in response to the held sampled signal and charge accumulated through the first switch, wherein the quantity is developed in response to the accumulated leakage charge in the second capacitor.
Public/Granted literature
- US20100066414A1 LEAKAGE COMPENSATION FOR SAMPLE AND HOLD DEVICES Public/Granted day:2010-03-18
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