Invention Grant
US07746473B2 Full spectrum adaptive filtering (FSAF) for low open area endpoint detection 失效
全频谱自适应滤波(FSAF)用于低开放端点检测

Full spectrum adaptive filtering (FSAF) for low open area endpoint detection
Abstract:
A method for precise endpoint detection during etch processing of a substrate based on adaptive filtering of the optical emission spectrum (OES) data, even in low open area etching, is provided. Endpoint detection performed in this manner offers the benefits of increased signal-to-noise ratio and decreased computation costs and delay when compared to conventional endpoint detection techniques.
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