Invention Grant
- Patent Title: Workpiece inspecting device
- Patent Title (中): 工件检查装置
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Application No.: US12324856Application Date: 2008-11-27
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Publication No.: US07748133B2Publication Date: 2010-07-06
- Inventor: Wei Liu
- Applicant: Wei Liu
- Applicant Address: CN Shenzhen, Guangdong Province TW Tu-Cheng, Taipei Hsien
- Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: CN Shenzhen, Guangdong Province TW Tu-Cheng, Taipei Hsien
- Agent Frank R. Niranjan
- Priority: CN200810301966.3 20080604
- Main IPC: G01B5/02
- IPC: G01B5/02

Abstract:
An exemplary workpiece inspecting device includes a base, a slider, a handle, a number of magnets, a number of probes and a measuring block. The slider is slidably mounted on the base and supports the handle thereon. The magnets are respectively embedded into the base for attracting and fixing a workpiece on the base. The probes are separately disposed on both the base and the slider for inspecting the perforations defined on a workpiece. The measuring block is attached on the slider for sliding and inspecting a thickness of the workpiece during the movement of the slider.
Public/Granted literature
- US20090300932A1 WORKPIECE INSPECTING DEVICE Public/Granted day:2009-12-10
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