Invention Grant
- Patent Title: Semiconductor device manufacturing method
- Patent Title (中): 半导体器件制造方法
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Application No.: US12336348Application Date: 2008-12-16
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Publication No.: US07749913B2Publication Date: 2010-07-06
- Inventor: Mitsuhiro Omura , Keisuke Kikutani , Yutaka Okamoto
- Applicant: Mitsuhiro Omura , Keisuke Kikutani , Yutaka Okamoto
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P.
- Priority: JP2007-326422 20071218
- Main IPC: H01L21/302
- IPC: H01L21/302

Abstract:
A first silicon containing film, an organic material film, a second silicon containing film are formed. The second silicon containing film is patterned to have a narrow width pattern and a wide width pattern. The organic material film is patterned to have a narrow width pattern and a wide width pattern. A side wall is formed on a side surface of the second silicon containing film and the organic material film by coating with a third silicon containing film. The narrow width pattern of the second silicon containing film is removed by using a mask that covers the second silicon containing film patterned to have a wide width pattern and the side wall. Finally, the organic material film is removed.
Public/Granted literature
- US20090163030A1 SEMICONDUCTOR DEVICE MANUFACTURING METHOD Public/Granted day:2009-06-25
Information query
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