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US07750338B2 Dual-SiGe epitaxy for MOS devices 有权
用于MOS器件的双SiGe外延

Dual-SiGe epitaxy for MOS devices
Abstract:
A semiconductor includes a semiconductor substrate, a gate stack on the semiconductor substrate, and a stressor having at least a portion in the semiconductor substrate and adjacent to the gate stack. The stressor includes a first stressor region and a second stressor region on the first stressor region, wherein the second stressor region extends laterally closer to a channel region underlying the gate stack than the first stressor region.
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