Invention Grant
- Patent Title: Phase detector utilizing analog-to-digital converter components
- Patent Title (中): 相位检测器利用模数转换器组件
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Application No.: US12039424Application Date: 2008-02-28
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Publication No.: US07750831B2Publication Date: 2010-07-06
- Inventor: Heyon Min Bae , Naresh Ramnath Shanbhag , Andrew C. Singer , Jonathan B. Ashbrook
- Applicant: Heyon Min Bae , Naresh Ramnath Shanbhag , Andrew C. Singer , Jonathan B. Ashbrook
- Applicant Address: US CA Sunnyvale
- Assignee: Finisar Corporation
- Current Assignee: Finisar Corporation
- Current Assignee Address: US CA Sunnyvale
- Agency: Workman Nydegger
- Main IPC: H03M1/00
- IPC: H03M1/00

Abstract:
Methods and systems are provided for an improved phase detector utilizing analog-to-digital converter (ADC) components. In an embodiment, the method includes from an ADC having a sampling clock signal that determines sampling instants, obtaining a first comparison value between an analog signal and a first threshold voltage at a first sampling instant, and obtaining a second comparison value between the analog signal and a second threshold voltage at a second sampling instant. The method further includes, from a supplemental circuit, obtaining a third comparison value between the analog signal and a third threshold voltage at a third sampling instant between the first and second sampling instants. The method further includes processing the first, second, and third comparison values to determine a phase relationship between the analog signal and the sampling clock.
Public/Granted literature
- US20090219008A1 PHASE DETECTOR UTILIZING ANALOG-TO-DIGITAL CONVERTER COMPONENTS Public/Granted day:2009-09-03
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