Invention Grant
- Patent Title: Camera calibration system and three-dimensional measuring system
- Patent Title (中): 相机校准系统和三维测量系统
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Application No.: US11658105Application Date: 2005-07-21
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Publication No.: US07750969B2Publication Date: 2010-07-06
- Inventor: Yukio Sato , Susumu Shibata
- Applicant: Yukio Sato , Susumu Shibata
- Applicant Address: JP JP
- Assignee: Japan Science and Technology Agency,Spacevision, Inc.
- Current Assignee: Japan Science and Technology Agency,Spacevision, Inc.
- Current Assignee Address: JP JP
- Agency: Cantor Colburn LLP
- Priority: JP2004-212947 20040721
- International Application: PCT/JP2005/013357 WO 20050721
- International Announcement: WO2006/009192 WO 20060126
- Main IPC: H04N5/225
- IPC: H04N5/225 ; H04N17/00 ; G06K9/00

Abstract:
Camera calibration which is robust against noise factors such as variation in environmental lighting and obstructions is realized. Light-emitting markers, whose on/off states can be controlled, are arrayed in a matrix on a reference panel on which an object is placed. The light-emitting markers blink in accordance with respective switching patterns in synchronism with the frame of continuous imaging of a camera. A three-dimensional measuring instrument determines the time-varying bright-and-dark pattern of a blinking point from the image of each frame and identifies, on the basis of the pattern, to which light-emitting marker each point corresponds. By reference to the identification results, camera calibration is performed, and a coordinate transformation parameter is computed.
Public/Granted literature
- US20080075324A1 Camera Calibration System and Three-Dimensional Measuring System Public/Granted day:2008-03-27
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